Application of static Automatic Test Program Generators /ATPG/ to dynamic circuitry
Abstract
A modelling approach is described which permits such static Automatic Test Program Generators as LOGOS, LASAR, and TESTAIDS to accommodate dynamic circuitry. Dynamic modelling is applicable to most circuits with onboard oscillators, with the ideal candidate having only one clock source, no dynamic output pins or test points, and the feeding of clock inputs to sequential devices by clock lines. The poorest candidates have many dynamic sources which feed combinational logic. The dynamic modelling process reviews the circuit logic diagram to identify all oscillators, traces their outputs to each of their sink devices or output pins, and determines the dynamic logic equivalent of each device.
- Publication:
-
AUTOTESTCON 1981; Proceedings of the Conference
- Pub Date:
- 1981
- Bibcode:
- 1981ieee.proc..361L
- Keywords:
-
- Automatic Test Equipment;
- Computer Programs;
- Digital Simulation;
- Logic Circuits;
- Static Tests;
- Test Pattern Generators;
- Dynamic Models;
- Failure Modes;
- Hardware;
- Logic Design;
- Network Analysis;
- Transfer Functions;
- Electronics and Electrical Engineering