Test generation using binary decision diagrams
Abstract
This paper formulates an approach for the development of a test strategy of complex LSI devices using graphical modeling techniques. A simple manual test generation algorithm using binary decision diagrams is presented. The treelike structure of the binary decision diagram is very similar to that of a controlled digraph. While the decision diagram describes the logical properties of a device, the controlled digraph describes information flow through the device. The controlled digraph is easily derived from the decision diagram. It is also a useful visual aid showing the logical interrelationship of binary decision diagrams. For the purpose of illustration, a binary decision diagram model and a controlled digraph model of the 2909 bit sliced microcontroller are presented.
 Publication:

AUTOTESTCON '81; Proceedings of the Conference
 Pub Date:
 1981
 Bibcode:
 1981ieee.proc..336W
 Keywords:

 Binary Data;
 Electronic Equipment Tests;
 Large Scale Integration;
 Systems Simulation;
 Test Pattern Generators;
 Trees (Mathematics);
 Complex Systems;
 Decision Making;
 Digital Systems;
 Graph Theory;
 Mathematical Models;
 Microprocessors;
 Performance Prediction;
 Electronics and Electrical Engineering