A systematic approach to comprehensive TPS diagnostics for electronic modules
Abstract
The paper examines methodlogies used in the generation of test program sets (TPS's) for analog, digital, and hybrid modules varying in complexity from simple combinational to complex circuits. Particular consideration is given to factors determining module ATG candidacy; the effect of X-dependent faults on fault detection; functional and gate level modeling; test generation non-ATG; dictionary generation; and diagnostic resolution. It is noted that initialization, fault modeling, dictionary mismatch problems, etc. must be resolved early in the evolution of the TPS in order to eliminate or reduce TPS validation problems on ATE.
- Publication:
-
AUTOTESTCON 1981; Proceedings of the Conference
- Pub Date:
- 1981
- Bibcode:
- 1981ieee.proc...28M
- Keywords:
-
- Automatic Test Equipment;
- Computer Programs;
- Electronic Equipment Tests;
- Electronic Modules;
- Failure Analysis;
- Analog Circuits;
- Complex Systems;
- Embedded Computer Systems;
- Hybrid Circuits;
- Logic Circuits;
- Methodology;
- Program Verification (Computers);
- Systems Simulation;
- Test Pattern Generators;
- Electronics and Electrical Engineering