Microcomputer based test system for charge coupled devices
Abstract
A microcomputer based system for testing analog charge coupled integrated circuits is described. It measures device performance for three parameters, dynamic range, baseline shift due to leakage current, and transfer efficiency. A companion board tester was developed. The software consists of a collection of BASIC and Assembly language routines developed on the test system microcomputer.
- Publication:
-
NASA STI/Recon Technical Report N
- Pub Date:
- February 1981
- Bibcode:
- 1981STIN...8216357S
- Keywords:
-
- Charge Coupled Devices;
- Electronic Equipment Tests;
- Integrated Circuits;
- Assembly Language;
- Basic (Programming Language);
- Microcomputers;
- Subroutines;
- Electronics and Electrical Engineering