Photon-electron correlation in the laboratory testing of electronic components. Part 2: Beam conditioning and diagnostics
Abstract
The limitations of using electrons to simulate the effects of high dose rate flash X-ray irradiations for TREE studies were determined. Diagnostic testing techniques were developed for such simulation and are described. The use of suitable dosimetry techniques for high total dose/dose-rate irradiations was demonstrated.
- Publication:
-
NASA STI/Recon Technical Report N
- Pub Date:
- 1981
- Bibcode:
- 1981STIN...8213365P
- Keywords:
-
- Electron Beams;
- Electronic Equipment;
- Irradiation;
- Radiation Hardening;
- Simulation;
- Component Reliability;
- Electron Emission;
- Photoionization;
- Radiation Dosage;
- Radiation Effects;
- X Rays;
- Electronics and Electrical Engineering