Electrical and reliability characterization of Schottky power diodes
Abstract
This program examined the barrier materials which were available in late 1978. Screening, electrical characterization and step stress testing were performed on six different processes power Schottky rectifiers. The proposed drafts of MIL-S-19500 detail specifications were prepared as part of this project. The data, proposed limits and related discussions are presented in this report.
- Publication:
-
NASA STI/Recon Technical Report N
- Pub Date:
- April 1981
- Bibcode:
- 1981STIN...8127411G
- Keywords:
-
- Electrical Properties;
- Reliability Engineering;
- Schottky Diodes;
- Charge Carriers;
- Semiconductor Diodes;
- Stress Analysis;
- Electronics and Electrical Engineering