Ultrasonic scanning of multilayer ceramic chip capacitors
Abstract
Ultrasonic scanning is compared to neutron radiography and scanning laser acoustic microscopy (SLAM). Data show that SLAM and ultrasonic scanning evaluations are in good agreement. There is poor agreement between N-ray and both ultrasonic techniques because N-ray is insensitive to all but the grossest delaminations. Statistical analysis show a good correlation between ultrasonic scanning and destructive physical analysis.
- Publication:
-
NASA STI/Recon Technical Report N
- Pub Date:
- June 1981
- Bibcode:
- 1981STIN...8126388B
- Keywords:
-
- Capacitors;
- Ceramics;
- Chips (Electronics);
- Failure Analysis;
- Neutron Radiography;
- Nondestructive Tests;
- Ultrasonic Tests;
- Acoustic Microscopes;
- Destructive Tests;
- Statistical Analysis;
- Electronics and Electrical Engineering