Microprocessor-Based Instrumentation For Bidirectional Reflectance Distribution Function (BRDF) Measurements From Visible To Far Infrared (FIR)
Abstract
A scattering instrument for making BRDF measurements is described. The instrument is microprocessor-controlled and is designed to obtain BRDF data at wavelengths of 0.6328, 1.15, 3.39, 10.6, 41.7, and eventually 118.8 microns.
- Publication:
-
Radiation scattering in optical systems
- Pub Date:
- March 1981
- DOI:
- 10.1117/12.959614
- Bibcode:
- 1981SPIE..257..177B
- Keywords:
-
- Bidirectional Reflectance;
- Distribution Functions;
- Laser Applications;
- Microprocessors;
- Optical Measuring Instruments;
- Scattering Functions;
- Carbon Dioxide Lasers;
- Design Analysis;
- Electronic Equipment;
- Far Infrared Radiation;
- Helium-Neon Lasers;
- Infrared Lasers;
- Light (Visible Radiation);
- Waveguide Lasers;
- Instrumentation and Photography