Reliability of AuGe/Pt and AuGe/Ni ohmic contacts on GaAs
Abstract
- Publication:
-
Electronics Letters
- Pub Date:
- June 1981
- DOI:
- 10.1049/el:19810283
- Bibcode:
- 1981ElL....17..407L
- Keywords:
-
- Circuit Reliability;
- Contact Resistance;
- Gallium Arsenides;
- Metal Films;
- Schottky Diodes;
- Eutectic Alloys;
- Germanium Alloys;
- Gold Alloys;
- Nickel Alloys;
- Platinum Alloys;
- Semiconductor Devices;
- Thermal Degradation;
- Electronics and Electrical Engineering