Computer aids for circuits designs
Abstract
Suitable simple and reliable computer aided circuit design methods for measuring data and processing model parameters were developed for integrated circuit design engineers. Test chips were modified in order to register the relevant measured data for different technologies. The measuring methods were improved in order to obtain more accurate and more reproducible data for the measuring programs and the computer. Device and process simulation programs were developed for models for bipolar and metal oxide semiconductor (MOS) transistors in order to determine model parameters.
- Publication:
-
Final Report
- Pub Date:
- December 1980
- Bibcode:
- 1980sgmg.rept.....P
- Keywords:
-
- Computer Aided Design;
- Computerized Simulation;
- Integrated Circuits;
- Bipolar Transistors;
- Circuit Boards;
- Computer Programs;
- Design Analysis;
- Metal Oxide Semiconductors;
- Statistical Analysis;
- Electronics and Electrical Engineering