Integrated circuit reliability. Citations from the NTIS data base
Abstract
The bibliography presents research pertinent to design, reliability prediction, failure and malfunction, processing techniques, and radiation damage. This updated bibliography contains 193 abstracts, 17 of which are new entries to the previous edition.
- Publication:
-
National Technical Information Service Report
- Pub Date:
- June 1980
- Bibcode:
- 1980ntis.reptTU...R
- Keywords:
-
- Bibliographies;
- Failure Analysis;
- Prediction Analysis Techniques;
- Radiation Damage;
- Design Analysis;
- Reliability Analysis;
- Electronics and Electrical Engineering