Measurement of the thermal conductivity of thin films
Abstract
A method for determining the thermal conductivity of thin films for use in thermoelectric devices is described. The thermal conductivity is determined by measuring the temperature of electrically heated specimens; formulas are obtained for calculating the thermal conductivity, with allowance for thermal emission from the surface of the specimen. Results are presented for several materials, including films of polyimide and nickel, mica and nickel, and antimony.
- Publication:
-
Materials and Processes for Use in Space Technology
- Pub Date:
- 1980
- Bibcode:
- 1980mpus.rept..138N
- Keywords:
-
- Temperature Measurement;
- Thermal Conductivity;
- Thermoelectric Materials;
- Thin Films;
- Antimony;
- Mica;
- Nickel;
- Polyimides;
- Space Commercialization;
- Surface Properties;
- Electronics and Electrical Engineering