An analysis of source structure effects in radio interferometry measurements

To begin a study of structure effects, this report presents a theoretical framework, proposes an effective position approach to structure corrections based on brightness distribution measurements, and analyzes examples of analytical and measured brightness distributions. Other topics include the effect of the frequency dependence of a brightness distribution on bandwidth synthesis (BWS) delay, the determination of the absolute location of a measured brightness distribution, and structure effects in dual frequency calibration of charged particle delays. For the 10 measured distributions analyzed, it was found that the structure effect in BWS delay at X-band (3.6 cm) can reach 30 cm, but typically falls in the range of 0 to 5 cm. A trial limit equation that is dependent on visibility was successfully tested against the 10 measured brightness distributions (seven sources). If the validity of this particular equation for an upper limit can be established for nearly all sources, the structure effect in BWS delay could be greatly reduced without supplementary measurements of brightness distributions.