Sensitive photothermal deflection technique for measuring absorption in optically thin media
Abstract
The study deals with photothermal deflection spectroscopy for measuring ultralow absorption in condensed-matter samples. Using differential ac synchronous detection electronics in conjunction with position sensors, a sensitivity of alpha l = 10 to the -7th for thin films and optical coatings and of 10 to the -8th for liquids have been achieved.
- Publication:
-
Optics Letters
- Pub Date:
- September 1980
- DOI:
- Bibcode:
- 1980OptL....5..377B
- Keywords:
-
- Electromagnetic Absorption;
- High Power Lasers;
- Optical Thickness;
- Photoabsorption;
- Thermal Blooming;
- Thin Films;
- Deflection;
- Gradient Index Optics;
- Nonlinear Optics;
- Optical Communication;
- Thermal Diffusion;
- Instrumentation and Photography