Real-time displacement and tilt analysis by a speckle technique using Bi 12SiO 20-crystals
Abstract
Storage of speckle pattern in real time by means of Bi 12SiO 20-crystals will be reported. Applying the double exposure technique, deformations, displacements as well as tilts can be analysed. The novel speckle technique displays the Young'-interference fringes in quasi real time.
- Publication:
-
Optics Communications
- Pub Date:
- September 1980
- DOI:
- 10.1016/0030-4018(80)90388-0
- Bibcode:
- 1980OptCo..34..327T
- Keywords:
-
- Attitude Indicators;
- Crystal Optics;
- Displacement Measurement;
- Optical Data Storage Materials;
- Real Time Operation;
- Speckle Patterns;
- Bismuth Compounds;
- Diffraction Patterns;
- Fourier Transformation;
- Photographic Recording;
- Silicon Oxides;
- Instrumentation and Photography