A simplified two-dimensional numerical analysis of MOS devices - DC case
Abstract
A simplified two-dimensional numerical analysis program has been developed for MOS devices. The calculation speed of this program is an order of magnitude faster than that of the finite-difference or finite-element methods due to the reduced number of analysis node points. The method solves only a one-dimensional current-continuity equation along the channel. Poisson's equation in two dimensions is replaced by an initial solution and a boundary-value problem formulation for the incremental potential and charge. In this method, the nodes are allocated only along the boundaries and the channel; therefore, it has a much smaller number of nodes than that required for other methods. MOS characteristics are simulated and compared with results from a finite-difference program. The agreement is satisfactory within 10 percent over a wide range of the substrate doping concentrations and channel lengths.
- Publication:
-
IEEE Transactions on Electron Devices
- Pub Date:
- November 1980
- DOI:
- Bibcode:
- 1980ITED...27.2101O
- Keywords:
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- Carrier Transport (Solid State);
- Computer Aided Design;
- Metal Oxide Semiconductors;
- Numerical Analysis;
- Semiconductor Devices;
- Boundary Value Problems;
- Computer Programs;
- Computerized Simulation;
- Continuity Equation;
- Direct Current;
- Performance Prediction;
- Poisson Equation;
- Signal Analysis;
- Electronics and Electrical Engineering