Analysis of a junction termination structure for ideal breakdown voltage in p-n junction devices
Abstract
- Publication:
-
IEEE Transactions on Electron Devices
- Pub Date:
- January 1980
- DOI:
- Bibcode:
- 1980ITED...27..261T
- Keywords:
-
- Electrical Faults;
- P-N Junctions;
- Semiconductor Devices;
- Volt-Ampere Characteristics;
- Concavity;
- Diodes;
- Electric Fields;
- Electron Avalanche;
- Electronics and Electrical Engineering