Determining the boundaries of an X-ray image of flaws on the basis of phase-frequency analysis
Abstract
A method based on phase-frequency analysis is proposed for tracing the boundaries of low-contrast X-ray images of flaws with small linear dimensions. The method, which involves instantaneous phase spectra determination of signals from optical density measurements, is shown to be highly sensitive and resistant to noise.
- Publication:
-
Defektoskopiia
- Pub Date:
- December 1980
- Bibcode:
- 1980Defek..16...56L
- Keywords:
-
- Materials Tests;
- Nondestructive Tests;
- X Ray Imagery;
- X Ray Inspection;
- Frequency Response;
- Optical Density;
- Phase Deviation;
- Quality Control;
- Instrumentation and Photography