Wide-band measuring system for studying charge-coupled device characteristics
Abstract
A wide-band four-channel measuring system was developed for studying charge-coupled devices and optimizing their characteristics. The system incorporates a high-to-low frequency processor capable of handling the 100 to 300 MHz high frequency clock CCD driver and generating the 0.5 to 10 MHz readout frequency, a microwave component based on a four-phase signal generator, a four-channel phase-matched RF power amplifier and a wide band CCD test fixture.
- Publication:
-
Presented at IEEE Nucl. Sci. Symp
- Pub Date:
- January 1979
- Bibcode:
- 1979nusc.sympQ....L
- Keywords:
-
- Characterization;
- Charge Coupled Devices;
- Measuring Instruments;
- Broadband;
- Frequency Analyzers;
- Optimization;
- Power Amplifiers;
- Signal Generators;
- Systems Engineering;
- Electronics and Electrical Engineering