A parametric model for multispectral scanners
Abstract
A set of test statistics are specified and the corresponding output quantities computed by the characteristic function. Two sets of classification accuracies, one at the input and one at the output are estimated. The scanner's instantaneous field of view is changed and the variation of the output classification performance is monitored.
- Publication:
-
In: Machine processing of remotely sensed data; Proceedings of the Fifth Annual Symposium
- Pub Date:
- 1979
- Bibcode:
- 1979mprs.symp..213M
- Keywords:
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- Multispectral Band Scanners;
- Photogrammetry;
- Remote Sensors;
- Statistical Analysis;
- Classifications;
- High Resolution;
- Linear Systems;
- Parameterization;
- Statistical Correlation;
- Instrumentation and Photography