Techniques for design, test and evaluation of GaAs FET components for phased array application

Advanced techniques which enhance the viability of solid-state phased array systems are presented. They include sophisticated small-signal and large-signal modeling of GaAs MESFET characteristics and power amplifier design methods. A test and evaluation program is introduced for making rapid performance characterization of subsystems and systems. The practicality of this technique is demonstrated by describing the NRL automatic test and evaluation facility, and the inclusion of actual test results of transceivers from an electronically agile phased array. This facility has both CW and pulsed measurement capability.