Particle-impact noise detection in semiconductors
Abstract
The paper presents the results of an attempt to optimize detection of loose particles in semiconductors by means of particle-impact noise detection (PIND), together with some observations on test efficiency. The test vibration parameters (frequency, acceleration, and displacement) were evaluated to determine their effects on detection sensitivity, and a relationship among them was defined and extrapolated to optimize detection. In addition, specimen mounting methods and supporting equipment (including threshold detection and sensitivity test units) were evaluated and specified, and detection displays and levels were evaluated and standardized.
- Publication:
-
In: Environmental stress screening of electronic hardware; Proceedings of the National Conference and Workshop
- Pub Date:
- 1979
- Bibcode:
- 1979esse.proc...59S
- Keywords:
-
- Acoustic Emission;
- Electronic Equipment Tests;
- Noise Measurement;
- Radiation Detectors;
- Semiconductor Devices;
- Vibration Tests;
- Avionics;
- Electroacoustic Transducers;
- Sensitivity;
- Electronics and Electrical Engineering