Diode step stress testing program for J ANTX1N972B
Abstract
The effect was studied of power/temperature step stress when applied to the zener diode JANTX1N972B manufactured by Siemens and Motorola. The power/temperature stress tests are presented, and failure analyses are included.
- Publication:
-
Final Report DCA Reliability Lab
- Pub Date:
- February 1979
- Bibcode:
- 1979dcar.reptU.....
- Keywords:
-
- Diodes;
- Performance Tests;
- Stress Analysis;
- Electric Potential;
- Failure Analysis;
- Reliability Engineering;
- Thermal Stresses;
- Electronics and Electrical Engineering