Diode step stress testing program for JANTX1N3031B
Abstract
The effect of power/temperature step stress when applied to the zener diode JANTX1N3031B manufactured by Siemens and Motorola is reported. A total of 48 samples from each manufacturer was submitted to the process. In addition, two control sample units were maintained for verification of the electrical parametric testing.
- Publication:
-
Final Report DCA Reliability Lab
- Pub Date:
- February 1979
- Bibcode:
- 1979dcar.reptRZ....
- Keywords:
-
- Diodes;
- Performance;
- Stress Analysis;
- Temperature Effects;
- Thermal Stresses;
- Acceptability;
- Electronic Equipment Tests;
- Quality Control;
- Reliability Analysis;
- Electronics and Electrical Engineering