Diode step stress program for JANTX1N3893
Abstract
Data for the purpose of evaluating the effect of power/temperature step stress on the diode JANTX1N3893 manufactured by Siemens and Motorola is presented. A total of 48 samples from each manufacturer were submitted to the process. In addition, two control sample units were maintained for verification of the electrical parametric testing.
- Publication:
-
Final Report DCA Reliability Lab
- Pub Date:
- January 1979
- Bibcode:
- 1979dcar.reptRV....
- Keywords:
-
- Diodes;
- Performance Tests;
- Stress Analysis;
- Electric Potential;
- Failure Analysis;
- Reliability Engineering;
- Thermal Stresses;
- Electronics and Electrical Engineering