Diode step stress program for JANTX1N4570A
Abstract
The effect of power/temperature step stress when applied to a variety of semiconductor devices was evaluated. Performance of the zener diode JANTX1N4570A manufactured by Siemens and Motorola is reported. A total of 48 samples from each manufacturer was submitted to the process outlined in Table 1. In addition, two control sample units were maintained for verification of the electrical parametric testing.
- Publication:
-
Final Report DCA Reliability Lab
- Pub Date:
- February 1979
- Bibcode:
- 1979dcar.reptQS....
- Keywords:
-
- Diodes;
- Stress Analysis;
- Thermal Stresses;
- Electronic Equipment Tests;
- Performance Tests;
- Quality Control;
- Reliability Analysis;
- Electronics and Electrical Engineering