Diode step stress program for JANTX1N5619
Abstract
The effect of power/temperature step stress was studied when applied to the Diode JANTX1N5619 manufactured by Semtech and Micro-Semiconductor. Test results, and failure analyses are presented.
- Publication:
-
Final Report DCA Reliability Lab
- Pub Date:
- January 1979
- Bibcode:
- 1979dcar.reptQQ....
- Keywords:
-
- Diodes;
- Performance Tests;
- Stress Analysis;
- Failure Analysis;
- Reliability Engineering;
- Semiconductor Devices;
- Thermal Stresses;
- Electronics and Electrical Engineering