A three dimensional roughness meter for improved evaluation of surface microcontours
Abstract
A critique of conventional profilometry is given after which a three-dimsiional approach to surface roughness characterization is offered. Emphasis is on the misleading nature of two-dimensional cutaway representations of surface contours. As an alternative, a contour following sensor is proposed which provides measurments in three dimensions as it is moved across the surface under investigation. The laboratory apparatus, including the pickup arm, its peripherals, a programmable calculator, and a graphic display, are described. As an example, a milled surface is studied, then compared with standard profilometric data. Results shown that the three-dimensional method does better at analyzing the homogeneity of a surface and that it is more efficient in revealing point defects.
- Publication:
-
Final Report Centre Technique des Industries Mecaniques
- Pub Date:
- July 1979
- Bibcode:
- 1979ctim.rept.....G
- Keywords:
-
- Dimensional Measurement;
- Measuring Instruments;
- Surface Roughness;
- High Pass Filters;
- Microstructure;
- Numerical Control;
- Plotters;
- Point Defects;
- Profilometers;
- Instrumentation and Photography