Fault diagnosis system for complex logic board

A modular fault diagnosis system for testing and fault localization on complex logic boards was developed. Modules with up to 560 logic pins based on data processing packaging technologies using ECL, TTL, or MOS circuits, as well as mixed configurations can be fully tested automatically. Fault diagnosis is accomplished with an automatic board tester in accordance with the fault path tracing method. An automatic tester operating system controls the rapid transfer of large data volumes at a high data rate. For writing test specimen programs, a problem oriented high level test language with an associated compiler is used.