Bulk- and surface-plasmon-loss intensities in photoelectron, Auger, and electron-energy-loss spectra of Mg metal
The intensities of plasmon-loss satellities in x-ray photoelectron (XPS) and electron-energy-loss (EEL) spectra of Mg metal have been determined. The method used has been described earlier in a similar study of aluminum. Intrinsic processes contribute 22% of the total plasmon intensity in the case of XPS core lines. The probability for extrinsic plasmon excitations is α=0.67, in good agreement with the value α=0.63 derived from the EEL spectra with primary-electron energies ranging from 300 to 1500 eV. For KLL and KLV Auger lines we find the same contributions of intrinsic and extrinsic processes to the plasmon intensities as for the XPS core lines. The line shapes of plasmon-loss lines are different in XPS and EEL spectra, and cannot be described as self-convolutions of the plasmon-energy distribution function.