Radioisotope X-ray fluorescent systems for measuring the thickness of coatings
Abstract
The physical basis of X-ray fluorescent gauges is outlined, and some aspects of the application of the gauges to micrometric thickness measurements are examined. The design, principle, and technological parameters of X-ray fluorescent gauges are discussed, along with the characteristics of the radioisotope sources and X-ray detectors. Some industrial applications of nondispersive X-ray fluorescence spectroscopy are noted.
- Publication:
-
Moscow Atomizdat
- Pub Date:
- 1979
- Bibcode:
- 1979MAtom....Q....B
- Keywords:
-
- Coatings;
- Dimensional Measurement;
- Film Thickness;
- Radioactive Isotopes;
- X Ray Fluorescence;
- Automatic Gain Control;
- Cost Effectiveness;
- Design Analysis;
- Instrument Errors;
- Lacquers;
- Laminates;
- Metal Coatings;
- Steels;
- Technology Utilization;
- Instrumentation and Photography