Calculation of thermal noise in J.F.E.T.s
Abstract
At frequencies above the range at which low-frequency-generation noise is dominant, thermal noise in the channel is the main noise source of a junction field-effect transistor. Starting from the well known current and continuity equations, the drain- and gate-noise spectra and their correlation coefficient are calculated by means of a series expansion, in a second-order approximation. The results are compared with calculations and measurements of other authors. There is good agreement with experiments, but differences exist with some of the earlier computations in the literature.
- Publication:
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IEE Journal of Solid-State Electron Devices
- Pub Date:
- September 1979
- Bibcode:
- 1979JSSED...3..137S
- Keywords:
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- Field Effect Transistors;
- Junction Transistors;
- Noise Spectra;
- Spectral Correlation;
- Thermal Noise;
- Correlation Coefficients;
- Electromagnetic Noise Measurement;
- Equivalent Circuits;
- Noise Generators;
- Series Expansion;
- Electronics and Electrical Engineering