An X-ray topographic assessment of cadmium mercury telluride
Abstract
This paper describes an X-ray topographic (Berg-Barrett) assessment of cadmium mercury telluride grown by the Bridgman and cast-recrystallize-anneal (CRA) methods. Reflection topographs reveal that the Bridgman material studied consists of large numbers of small grains (0.05 to 0.6 mm) with misorientations from 1 to 9 minutes per grain. In contrast, the CRA material studied had only a few grain boundaries and features consistent with a strained lattice, possibly caused by compositional variations.
- Publication:
-
Journal of Materials Science
- Pub Date:
- March 1979
- DOI:
- 10.1007/BF00772722
- Bibcode:
- 1979JMatS..14..619B
- Keywords:
-
- Cadmium Tellurides;
- Mercury Tellurides;
- Metallography;
- Semiconductors (Materials);
- X Ray Analysis;
- Crystal Growth;
- Lattice Parameters;
- Topography;
- Solid-State Physics