Analytical models of threshold voltage and breakdown voltage of short-channel MOSFET's derived from two-dimensional analysis
Abstract
- Publication:
-
IEEE Journal of Solid-State Circuits
- Pub Date:
- April 1979
- DOI:
- 10.1109/JSSC.1979.1051188
- Bibcode:
- 1979IJSSC..14..375T
- Keywords:
-
- Electric Potential;
- Field Effect Transistors;
- Metal Oxide Semiconductors;
- Threshold Voltage;
- Electrical Faults;
- N-Type Semiconductors;
- Volt-Ampere Characteristics;
- Electronics and Electrical Engineering