Transient phenomena analysis
Abstract
The work described in the present paper has demonstrated that speckle pattern techniques can be successfully applied to transient phenomena analysis and that they can be used to study differences between two static configurations of an object and to record the dynamic evolution of a configuration within a complete time interval. Some experiments in modern optics in which transient speckle patterns can be used to good advantage are noted.
- Publication:
-
Speckle Metrology
- Pub Date:
- 1978
- Bibcode:
- 1978spme.book..267D
- Keywords:
-
- Displacement Measurement;
- Optical Measuring Instruments;
- Speckle Patterns;
- Transient Response;
- Heat Treatment;
- Holographic Interferometry;
- Laser Applications;
- Mechanical Properties;
- Petroleum Products;
- Photographic Measurement;
- Solid Propellants;
- Television Transmission;
- Instrumentation and Photography