Semiconductor measurement technology: Microelectronic Processing Laboratory at NBS
Abstract
The facilities and processes used at NBS for the fabrication of npn silicon transistors in support of the process control and measurement technology are described. Details of techniques used for contamination control, and the various steps required for the preparation of planar silicon transistors are included. The electrical properties of the devices is also discussed.
- Publication:
-
Interim Report
- Pub Date:
- December 1978
- Bibcode:
- 1978nbs..reptS....L
- Keywords:
-
- Microelectronics;
- Semiconductors (Materials);
- Silicon Transistors;
- Diffusion;
- Electrical Properties;
- Fabrication;
- Planar Structures;
- Electronics and Electrical Engineering