Latch-up and radiation integrated circuit--LURIC: A test chip for CMOS latch-up investigation

A CMOS integrated circuit test chip latch-up and radiation integrated circuit (LURIC), designed for CMOS latch-up and radiation effects research is described. The purpose of LURIC is (1) to provide information on the physics of CMOS latch-up; (2) to study the layout dependence of CMOS latch-up; and (3) to provide special latch-up test structures for the development and verification of a latch-up model. Test devices and related test structures of the LURIC are also described.