High-speed electron-beam lithographic resists for micron and submicron integrated circuits
Abstract
Next-generation RADAR and ELINT systems are planned to provide the field commander with comprehensive intelligence on the disposition of enemy weapons and electronics equipment. Ultra-compact signal processors with unprecedented capabilities are the heart of these systems. Fabrication of the required high-density integrated circuits (IC's), with elements in the micron to submicron range, is beyond the resolution limit of state-of-the-art optical photolithography. Electrons with 10-20 keV energies can be accurately focused to beam diameters much less than a micron. Electron-beam lithography (EBL) meets the projected resolution requirements, and is expected to be a key technology for the production of sophisticated new digital communications systems for the Army.
- Publication:
-
NASA STI/Recon Technical Report N
- Pub Date:
- June 1978
- Bibcode:
- 1978STIN...7910349H
- Keywords:
-
- Electron Beams;
- Integrated Circuits;
- Lithography;
- Digital Systems;
- High Speed Cameras;
- Photolithography;
- Pulse Communication;
- Signal Processing;
- Electronics and Electrical Engineering