On the theory of sublinear current-voltage characteristics of semiconductor structures
Abstract
The strong carriers accumulation in the high resistive region of semiconductor structures giving rise to field-opposed diffusion of free carriers may result in the sublinear current-voltage dependence [ V ∝ exp ( Iaw)], which is extremely sensitive to external influences.
- Publication:
-
Solid State Communications
- Pub Date:
- July 1978
- DOI:
- 10.1016/0038-1098(78)90529-X
- Bibcode:
- 1978SSCom..27..339L