Factors Influencing Seebeck Effect of Thin Tellurium Films.
Abstract
Tellurium films were deposited and maintained in a vacuum during the course of the electrical measurements. The conductivity, Seebeck emf and Seebeck coefficient were determined as a function of temperature difference for films of thickness 100 to 2000 A. All the films showed a parabolic relationship between Seebeck emf and temperature difference. The Seebeck coefficient was, therefore, a linear function of the temperature difference and it was of positive sign.
- Publication:
-
Ph.D. Thesis
- Pub Date:
- 1978
- Bibcode:
- 1978PhDT........12O
- Keywords:
-
- Physics: Condensed Matter;
- Seebeck Effect;
- Tellurium;
- Thin Films;
- Deposition;
- Electrical Properties;
- Electrical Resistivity;
- Film Thickness;
- Temperature Effects;
- Vacuum;
- Solid-State Physics