A new method for X-ray diffraction by oscillation technique
Abstract
A new oscillation-type apparatus for X-ray diffraction consists of a part that rotates the specimen about the surface normal and another part that swings the specimen in a wide arc about an oscillation axis. Materials with coarse-grained crystals or textured grains can be studied with the apparatus. Maximum grain size that can be handled by this method at an oscillation angle of plus or minus 30 degrees was found to be about 17 times (850 microns) as large as the maximum grain size suitable for X-ray diffraction study without oscillation.
- Publication:
-
Japan Institute of Metals Journal
- Pub Date:
- July 1978
- Bibcode:
- 1978JaIMJ..42..698K
- Keywords:
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- Grain Boundaries;
- Metal Crystals;
- Vibration Tests;
- X Ray Diffraction;
- Aluminum Alloys;
- Diffraction Patterns;
- Mechanical Oscillators;
- Nickel Alloys;
- Polycrystals;
- Powder Metallurgy;
- Rotating Bodies;
- Silicon;
- Instrumentation and Photography