Hardness assurance guidelines for moderate neutron environment effects in bipolar transistors and integrated circuits
Abstract
- Publication:
-
IEEE Transactions on Nuclear Science
- Pub Date:
- December 1978
- DOI:
- 10.1109/TNS.1978.4329571
- Bibcode:
- 1978ITNS...25.1555B
- Keywords:
-
- Bipolar Transistors;
- Component Reliability;
- Integrated Circuits;
- Neutron Irradiation;
- Quality Control;
- Radiation Hardening;
- Circuit Reliability;
- Failure Analysis;
- Hardness Tests;
- Neutron Emission;
- Normal Density Functions;
- Radiation Effects;
- Statistical Analysis;
- Electronics and Electrical Engineering