C-MOS/SOS LSI input/output protection networks
Abstract
An improved input and output electrical surge protection has been developed for C-MOS and MNOS large-scale integrated circuitry fabricated on sapphire. The failure mode was designed to be the input- or output-series limiting diffused resistor, which can be controlled reliably through the fabrication processes. Forward-bias diodes attenuate the overvoltage surges. Failure energies and voltages have been evaluated, and design equations are developed and verified.
- Publication:
-
IEEE Transactions on Electron Devices
- Pub Date:
- August 1978
- DOI:
- Bibcode:
- 1978ITED...25..933A
- Keywords:
-
- Circuit Protection;
- Cmos;
- Failure Analysis;
- Large Scale Integration;
- Sos (Semiconductors);
- Burnthrough (Failure);
- Circuit Reliability;
- Electric Discharges;
- Electric Pulses;
- Electrical Faults;
- Fabrication;
- Failure Modes;
- Metallizing;
- Reliability Engineering;
- Electronics and Electrical Engineering