The use of X-ray microanalysis to study diffusion processes in solids
Abstract
The review deals with the applicability of electron probe microanalysis to diffusion coefficient measurements in solids. A brief characterization of this microanalytic method is presented and the method is compared with other conventional diffusion techniques. A short description of the advantages of electron probe microanalysis is given as well as of difficulties which may limit the use of this technique in some cases. The influence of the effective size of the analyzed volume on measured values of small diffusion coefficients is discussed in detail.
- Publication:
-
Ceskoslovensky Casopis pro Fyziku Sekce
- Pub Date:
- 1978
- Bibcode:
- 1978CCpFS..28..349G
- Keywords:
-
- Diffusion Coefficient;
- Electron Probes;
- Microanalysis;
- Self Diffusion (Solid State);
- X Ray Analysis;
- Absorptivity;
- Electron Optics;
- Radioactive Isotopes;
- Solids;
- Instrumentation and Photography