JAN transistor and diode characterization test program, JANTX diode 1N5619
Abstract
A statistical summary of electrical characterization was performed on JANTX 1N5619 silicon diodes. Parameters are presented with test conditions, mean, standard deviation, lowest reading, 10% point, 90% point, and highest reading.
- Publication:
-
Final Report DCA Reliability Lab
- Pub Date:
- February 1977
- Bibcode:
- 1977dcar.reptQ....T
- Keywords:
-
- Characterization;
- Diodes;
- Statistical Analysis;
- Transistors;
- Component Reliability;
- Electronic Equipment Tests;
- Histograms;
- Electronics and Electrical Engineering