Improved surface damage by radio-frequency sputtered overcoating
Abstract
Ten dielectric materials were deposited in half-wavelength optically thick films on dielectric substrate with varying surface roughness. The films were subjected to damaging radiation from a TEM mode ND(+3) in glass laser operating at 1.06 micrometers. The threshold optical field for damage was determined for each film. It was demonstrated that substrate roughness was an overriding consideration in the thin-film thresholds and that no masking of defects by the film was exhibited.
- Publication:
-
Final Report Air Force Weapons Lab
- Pub Date:
- March 1977
- Bibcode:
- 1977afwl.rept.....B
- Keywords:
-
- Film Thickness;
- Laser Damage;
- Radio Waves;
- Sputtering;
- Substrates;
- Surface Finishing;
- Defects;
- Dielectrics;
- Radiation Effects;
- Surface Roughness;
- Lasers and Masers