Thermal defects in CdSb doped with Ag

An experiment was conducted to investigate the effect of thermal defects on the stability of a thermoelectric material consisting of a CdSb base doped with Ag. The rate of relaxation of thermal defects in the range -50-+50 C is exceedingly small and leads to an insignificant change in electrical conductivity (0.1% per year) and to an even smaller change in the thermo emf, which is totally acceptable for most thermo elements used in measurement technology.