Effects of parameter errors on yield determinations from shock range-time data. Part 1: The universal equation
Abstract
The magnitude of the errors involved in yields determined with SLIFER (shorted location induction from frequency of electrical resonance) data (the most common form of range vs time information) are questioned again and again. A satisfactory answer is seldom possible because of the many interacting parts of the problem. A partial solution is presented here, the effect on calculated yield of a particular change in input can now be estimated. The present approach is completely analytical; noise or other uncertainties associated with real data-acquisition and data-reduction systems are not considered.
- Publication:
-
NASA STI/Recon Technical Report N
- Pub Date:
- July 1977
- Bibcode:
- 1977STIN...7824489O
- Keywords:
-
- Error Analysis;
- Inductance;
- Yield;
- Electrical Impedance;
- Numerical Analysis;
- Resonance;
- Electronics and Electrical Engineering