JAN transistor and diode characterization test program
Abstract
A statistical summary of electrical characterization was performed on JAN diodes and transistors. Parameters are presented with test conditions, mean, standard deviation, lowest reading, 10% point, 90% point and highest reading.
- Publication:
-
NASA STI/Recon Technical Report N
- Pub Date:
- March 1977
- Bibcode:
- 1977STIN...7811297T
- Keywords:
-
- Characterization;
- Diodes;
- Equipment Specifications;
- Statistical Analysis;
- Transistors;
- Component Reliability;
- Electronic Equipment Tests;
- Histograms;
- Electronics and Electrical Engineering