Numerical investigation of turn-on conditions in TRAPATT oscillators
Abstract
A computer simulation of TRAPATT diode-circuit interactions has been used to study high-frequency oscillatory phenomena that are seen experimentally to occur simultaneously with TRAPATT initiation. The simulation combines a solution of the diode internal dynamics using the method of characteristics with a time-domain coaxial-circuit analysis. By determining its dependence on circuit and diode bias conditions, the high-frequency oscillation is shown to be a relaxation, not an IMPATT oscillation. The relaxation oscillation can be tuned by adjusting to TRAPATT bias current to minimize TRAPATT start-up time. A two-step (high-low) bias pulse, or ingenious utilization of ringing in the bias circuit, can also be used to minimize start-up time.
- Publication:
-
IEEE Transactions on Electron Devices
- Pub Date:
- February 1977
- DOI:
- 10.1109/T-ED.1977.18691
- Bibcode:
- 1977ITED...24..128B
- Keywords:
-
- Avalanche Diodes;
- Microwave Oscillators;
- Relaxation Oscillators;
- Trapatt Devices;
- Computerized Simulation;
- Transient Response;
- Trigger Circuits;
- Electronics and Electrical Engineering